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[IEEE 2006 IEEE International Conference on IC Design and Technology - Padova, Italy ()] 2006 IEEE International Conference on IC Design and Technology - Nanoscale Si-based 3-dimensional MOSFETs

Donggun Park,, Dong-Won Kim,, Byung-Il Ryu,
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Year:
2006
Language:
english
DOI:
10.1109/ICICDT.2006.220798
File:
PDF, 1.92 MB
english, 2006
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