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[IEEE 2008 3rd International Conference on Sensing Technology (ICST 2008) - Taipei, Taiwan (2008.11.30-2008.12.3)] 2008 3rd International Conference on Sensing Technology - Three dimensional evaluation of parallelepiped flaw using amorphous MI sensor and neural network in biaxial MFLT
Abe, Masataka, Biwa, Shiro, Matsumoto, EijiYear:
2008
Language:
english
DOI:
10.1109/ICSENST.2008.4757105
File:
PDF, 658 KB
english, 2008