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[IEEE 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - Lubeck, Germany (2007.08.29-2007.08.31)] 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - The Criteria of Functional Delay Test Quality Assessment
Bareisa, E., Jusas, V., Motiejunas, K., Seinauskas, R.Year:
2007
Language:
english
DOI:
10.1109/DSD.2007.4341470
File:
PDF, 541 KB
english, 2007