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[IEEE 2009 Annual IEEE India Conference - Ahmedabad, India (2009.12.18-2009.12.20)] 2009 Annual IEEE India Conference - A Hybrid Test Architecture to Reduce Test Application Time in Full Scan Sequential Circuits
Ghosh, Priyankar, Mitra, Srobona, Sengupta, Indranil, Bhattacharya, Bhargab, Seth, SharadYear:
2009
Language:
english
DOI:
10.1109/INDCON.2009.5409404
File:
PDF, 110 KB
english, 2009