Analysis of the XPS and optical reflectivity spectra of the chemically etched Si(111) surfaces
R.J. Iwanowski, J.W. SobczakVolume:
76
Year:
1995
Language:
english
Pages:
6
DOI:
10.1016/0368-2048(95)02461-1
File:
PDF, 425 KB
english, 1995