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[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Failure Mechanisms of AIN based RF-MEMS Switches Under DC and ESD Stresses
Ruan, J., Nolhier, N., Bafleur, M., Bary, L., Mauran, N., Coccetti, F., Lisec, T., Plana, R.Year:
2007
Language:
english
DOI:
10.1109/IPFA.2007.4378070
File:
PDF, 3.18 MB
english, 2007