[IEEE Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2007.03.18-2007.03.22)] Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Non-Contact Surface Temperature Measurements Coupled with Ultrafast Real-Time Computation
Raad, Peter E., Komarov, Pavel L., Burzo, Mihai G.Year:
2007
Language:
english
DOI:
10.1109/STHERM.2007.352406
File:
PDF, 496 KB
english, 2007