[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Influence of die attachment on MOS transistor matching
Bastos, J., Steyaert, M., Graindourze, B., Sansen, W.Year:
1996
Language:
english
DOI:
10.1109/ICMTS.1996.535617
File:
PDF, 536 KB
english, 1996