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[IEEE 2006 International Workshop on Nano CMOS (IWNC) - Mishima, Japan (2006.01.30-2006.02.1)] 2006 International Workshop on Nano CMOS - Influences of annealing conditions on flatband voltage properties using continuously workfunction-tuned metal electrodes
Ohmori, K., Ahmet, P., Shiraishi, K., Watanabe, H., Akasaka, Y., Yamabe, K., Yoshitake, M., Chang, K.-S., Green, M. L., Yamada, K., Chikyow, T.Year:
2006
Language:
english
DOI:
10.1109/IWNC.2006.4570988
File:
PDF, 100 KB
english, 2006