[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability study of bilayer graphene - material for future transistor and interconnect
Tianhua Yu,, Eun-Kyu Lee,, Briggs, Benjamin, Nagabhirava, Bhaskar, Bin Yu,Year:
2010
Language:
english
DOI:
10.1109/IRPS.2010.5488851
File:
PDF, 494 KB
english, 2010