![](/img/cover-not-exists.png)
[IEEE 2007 IEEE Compound Semiconductor Integrated Circuits Symposium - Portland, OR, USA (2007.10.14-2007.10.17)] 2007 IEEE Compound Semiconductor Integrated Circuits Symposium - Thermal Properties and Reliability of GaN Microelectronics: Sub-Micron Spatial and Nanosecond Time Resolution Thermography
Kuball, Martin, Pomeroy, James W., Simms, Richard, Riedel, Gernot J., Ji, Hangfeng, Sarua, Andrei, Uren, Michael J., Martin, TrevorYear:
2007
Language:
english
DOI:
10.1109/CSICS07.2007.32
File:
PDF, 217 KB
english, 2007