[IEEE 2007 IEEE Compound Semiconductor Integrated Circuits...

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[IEEE 2007 IEEE Compound Semiconductor Integrated Circuits Symposium - Portland, OR, USA (2007.10.14-2007.10.17)] 2007 IEEE Compound Semiconductor Integrated Circuits Symposium - Thermal Properties and Reliability of GaN Microelectronics: Sub-Micron Spatial and Nanosecond Time Resolution Thermography

Kuball, Martin, Pomeroy, James W., Simms, Richard, Riedel, Gernot J., Ji, Hangfeng, Sarua, Andrei, Uren, Michael J., Martin, Trevor
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Year:
2007
Language:
english
DOI:
10.1109/CSICS07.2007.32
File:
PDF, 217 KB
english, 2007
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