[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - Redundancy removal and test generation for circuits with non-Boolean primitives
Chakradhar, S.T., Rothweiler, S.G., Agrawal, V.D.Année:
1995
Langue:
english
DOI:
10.1109/VTEST.1995.512611
Fichier:
PDF, 839 KB
english, 1995