[IEEE 2008 IEEE International Carnahan Conference on Security Technology (ICCST) - Prague, Czech Rebulic (2008.10.13-2008.10.16)] 2008 42nd Annual IEEE International Carnahan Conference on Security Technology - Evaluation methodology for fake samples detection in biometrics
Fernandez-Saavedra, Belen, Sanchez-Reillo, Raul, Alonso-Moreno, Raul, Sanchez-Avila, CarmenYear:
2008
Language:
english
DOI:
10.1109/CCST.2008.4751307
File:
PDF, 442 KB
english, 2008