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[IEEE 2008 IEEE International Carnahan Conference on Security Technology (ICCST) - Prague, Czech Rebulic (2008.10.13-2008.10.16)] 2008 42nd Annual IEEE International Carnahan Conference on Security Technology - Evaluation methodology for fake samples detection in biometrics

Fernandez-Saavedra, Belen, Sanchez-Reillo, Raul, Alonso-Moreno, Raul, Sanchez-Avila, Carmen
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Year:
2008
Language:
english
DOI:
10.1109/CCST.2008.4751307
File:
PDF, 442 KB
english, 2008
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