[IEEE 2014 IEEE International Meeting for Future of...

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[IEEE 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2014.6.19-2014.6.20)] 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Characteristics of a microbridge type MEMS sensor for the thermal conductivity measurement of gases by a steady state method

Fujii, Kenta, Muraoka, Shigenobu, Omatu, Sigeru, Yano, Mitsuaki
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Year:
2014
Language:
english
DOI:
10.1109/IMFEDK.2014.6867052
File:
PDF, 331 KB
english, 2014
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