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[IEEE 1991, International Test Conference - Nashville, TN (Oct. 26-30 1991)] 1991, Proceedings. International Test Conference - CURRENT VS. LOGIC TESTING OF GATE OXIDE SHORT, FLOATING GATE AND BRIDGING FAILURES IN CMOS
Rodriguez-Montanes, R., Segura, J.A., Champac, V.H., Figueras, J., Rubio, J.A.Year:
1991
Language:
english
DOI:
10.1109/TEST.1991.519713
File:
PDF, 827 KB
english, 1991