[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - Testability Evaluation for Analog Linear Circuits Via Transfer Function Analysis
Cannas, B., Fanni, A., Montisci, A.Year:
2005
Language:
english
DOI:
10.1109/ISCAS.2005.1464757
File:
PDF, 300 KB
english, 2005