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[IEEE 2006 IEEE International Conference on Microelectronic Test Structures - Austin, TX, USA (2006.03.6-2006.03.9)] 2006 IEEE International Conference on Microelectronic Test Structures - Analysis and modeling of substrate impedance network in RF CMOS

Bouhana, E., Scheer, P., Boret, S., Gloria, D., Dambrine, G., Minondo, M., Jaouen, H.
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Year:
2006
Language:
english
DOI:
10.1109/ICMTS.2006.1614277
File:
PDF, 326 KB
english, 2006
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