[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Session 5: Characterization, reliability, and yield BTI in SiON and high k FETs
Zafar, Sufi, Bersuker, GennadiYear:
2008
DOI:
10.1109/IEDM.2008.4796624
File:
PDF, 89 KB
2008