[IEEE IEEE/SEMI. 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop - Boston, MA, USA (23-25 Sept. 1998)] IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168) - Human based knowledge for the probe failure pattern classification with the use of a backpropagation neural network. Application on submicron linear technologies
Ortega, C., Ignacio, J., Montull, A., Sobrino, E.Year:
1998
Language:
english
DOI:
10.1109/ASMC.1998.731547
File:
PDF, 1.04 MB
english, 1998