[IEEE IEEE/SEMI. 1998 IEEE/SEMI Advanced Semiconductor...

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[IEEE IEEE/SEMI. 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop - Boston, MA, USA (23-25 Sept. 1998)] IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168) - Human based knowledge for the probe failure pattern classification with the use of a backpropagation neural network. Application on submicron linear technologies

Ortega, C., Ignacio, J., Montull, A., Sobrino, E.
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Year:
1998
Language:
english
DOI:
10.1109/ASMC.1998.731547
File:
PDF, 1.04 MB
english, 1998
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