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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Charge loss mechanisms and its implications for Programmable Floating Gate Voltage Reference
Nigam, T., Ozbek, O., Jenne, F., Shakeri, K., Jang, J., Puchner, H., Geha, S.Year:
2008
Language:
english
DOI:
10.1109/RELPHY.2008.4558899
File:
PDF, 257 KB
english, 2008