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[IEEE 2003. Design Automation Conference - Anaheim, CA, USA (2-6 June 2003)] Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) - Test generation for designs with multiple clocks
Xijiang Lin,, Thompson, R.Year:
2003
Language:
english
DOI:
10.1109/DAC.2003.1219101
File:
PDF, 666 KB
english, 2003