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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Test and debug features of the RTO7 chip
van Kaam, K., Vermeulen, B., Henk Jan Bergveld,Year:
2005
Language:
english
DOI:
10.1109/TEST.2005.1583985
File:
PDF, 641 KB
english, 2005