[IEEE IEEE International Conference on Test, 2005. -...

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Test and debug features of the RTO7 chip

van Kaam, K., Vermeulen, B., Henk Jan Bergveld,

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Year:

2005

Language:

english

DOI:

10.1109/TEST.2005.1583985

File:

PDF, 641 KB

english, 2005

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