[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Comparison of Negative Bias Temperature Instability in HfSiO(N)/TaN and SiO(N)/poly-Si pMOSFETs
Maheta, V. D., Purawat, S., Gupta, G.Year:
2007
Language:
english
DOI:
10.1109/IPFA.2007.4378064
File:
PDF, 381 KB
english, 2007