[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - The design of a lumped element impedance-matching network with reduced parasitic effects obtained from numerical modeling
Shaofeng Luan,, Jun Fan,, Knighten, J.L., Smith, N.W.Year:
2004
Language:
english
DOI:
10.1109/ISEMC.2004.1349960
File:
PDF, 306 KB
english, 2004