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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Fundamental failure mechanisms limiting maximum voltage operation in AlGaN/GaN HEMTs
Hodge, Michael D., Vetury, Ramakrishna, Shealy, Jeffrey B.Year:
2012
Language:
english
DOI:
10.1109/IRPS.2012.6241816
File:
PDF, 656 KB
english, 2012