![](/img/cover-not-exists.png)
[IEEE ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Impact of stress on various circuit characteristics in 65nm PDSOI technology
Suryagandh, Sushant, Gupta, Mayank, Zhi-Yuan Wu,, Krishnan, Srinath, Pelella, Mario, Jung-Suk Goo,, Thuruthiyil, Ciby, Judy X. An,, Chen, Brian Q., Subba, Niraj, Zamudio, Luis, Yonemura, James, IceYear:
2007
Language:
english
DOI:
10.1109/ESSCIRC.2007.4430260
File:
PDF, 208 KB
english, 2007