![](/img/cover-not-exists.png)
[IEEE 2013 IEEE 13th International Working Conference on Source Code Analysis and Manipulation (SCAM) - Eindhoven, Netherlands (2013.09.22-2013.09.23)] 2013 IEEE 13th International Working Conference on Source Code Analysis and Manipulation (SCAM) - Criticality of defects in cyclic dependent components
Oyetoyan, Tosin Daniel, Conradi, Reidar, Soares Cruzes, DanielaYear:
2013
Language:
english
DOI:
10.1109/SCAM.2013.6648180
File:
PDF, 1.43 MB
english, 2013