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[IEEE 2011 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Chennai, India (2011.07.4-2011.07.6)] 2011 IEEE Computer Society Annual Symposium on VLSI - Optimizing Test Wrapper for Embedded Cores Using TSV Based 3D SOCs
Roy, Surajit Kumar, Giri, Chandan, Ghosh, Sourav, Rahaman, HafizurYear:
2011
Language:
english
DOI:
10.1109/ISVLSI.2011.33
File:
PDF, 193 KB
english, 2011