Threshold voltage dependence of LOCOS-isolated thin-film...

Threshold voltage dependence of LOCOS-isolated thin-film SOI NMOSFET on buried oxide thickness

Jong-wook Lee, Hyung-ki Kim, Min-rok Oh, Yo-hwan Koh
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Volume:
20
Year:
1999
Language:
english
DOI:
10.1109/55.784458
File:
PDF, 49 KB
english, 1999
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