[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - A temperature control solution applied to IC failure analysis at low temperature
Li, Jinglong, Liu, JonathonYear:
2012
Language:
english
DOI:
10.1109/IPFA.2012.6306267
File:
PDF, 1.14 MB
english, 2012