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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Neutron soft error rate measurements in a 90-nm CMOS process and scaling trends in SRAM from 0.25-μm to 90-nm generation
Hazucha, P., Karnik, T., Maiz, J., Walstra, S., Bloechel, B., Tschanz, J., Dermer, G., Hareland, S., Armstrong, P., Borkar, S.Year:
2003
Language:
english
DOI:
10.1109/IEDM.2003.1269336
File:
PDF, 270 KB
english, 2003