[IEEE 2002 IEEE/LEOS International Conference on Optical MEMS - Lugano, Switzerland (20-23 Aug. 2002)] IEEE/LEOS International Conference on Optical MEMs - Theoretical and experimental characterization of fully metal coated scanning near-field optical microscopy SiO/sub 2/ tips
Vaccaro, L., Aeschimann, L., Akiyama, T., Eckert, R., Heinzelmann, H., De Rooij, N.F., Staufer, U., Herzig, H.P.Year:
2002
Language:
english
DOI:
10.1109/OMEMS.2002.1031417
File:
PDF, 97 KB
english, 2002