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[IEEE 2006 1ST IEEE International Conference on E-Learning in Industrial Electronics - Hammamet, Tunisia (2006.12.18-2006.12.20)] 2006 1ST IEEE International Conference on E-Learning in Industrial Electronics - Defect Identification Using Artificial Neural Networks And Finite Element Method
Hacib, Tarik, Mekideche, M. Rachid, Ferkha, NassiraYear:
2006
Language:
english
DOI:
10.1109/ICELIE.2006.347207
File:
PDF, 231 KB
english, 2006