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[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - ESD damage and solutions in tape head manufacturing
Lam, Michelle, Bookin, William, Czarnecki, Stanley, Golcher, Peter, Iben, Icko E. T., Wo, Richard DJYear:
2007
Language:
english
DOI:
10.1109/EOSESD.2007.4401744
File:
PDF, 755 KB
english, 2007