[IEEE 2009 IEEE International Test Conference (ITC) -...

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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - A novel array-based test methodology for local process variation monitoring

Luo, Tseng-Chin, Chao, Mango C.-T., Wu, Michael S.-Y., Li, Kuo-Tsai, Hsia, Chin. C., Tseng, Huan-Chi, Huang, Chuen-Uan, Chang, Yuan-Yao, Pan, Samuel C., Young, Konrad K.-L.
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Year:
2009
Language:
english
DOI:
10.1109/TEST.2009.5355656
File:
PDF, 816 KB
english, 2009
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