[IEEE 2010 IEEE Workshop on Biometric Measurements and...

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[IEEE 2010 IEEE Workshop on Biometric Measurements and Systems for Security and Medical Applications (BIOMS) - Taranto, Italy (2010.09.9-2010.09.9)] 2010 IEEE Workshop on Biometric Measurements and Systems for Security and Medical Applications - Low-cost face biometry for visually impaired users

Balduzzi, L., Fusco, G., Odone, F., Dini, S., Mesiti, M., Destrero, A., Lovato, A.
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Year:
2010
Language:
english
DOI:
10.1109/BIOMS.2010.5610444
File:
PDF, 773 KB
english, 2010
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