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[IEEE 2006 International Workshop on Nano CMOS (IWNC) - Mishima, Japan (2006.01.30-2006.02.1)] 2006 International Workshop on Nano CMOS - Defect energy levels in HfO2
Robertson, John, Ka Xiong,Year:
2006
Language:
english
DOI:
10.1109/IWNC.2006.4570991
File:
PDF, 86 KB
english, 2006