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[IEEE Comput. Soc. Press IEEE VLSI Test Symposium - Cherry Hill, NJ, USA (25-28 April 1994)] Proceedings of IEEE VLSI Test Symposium - Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design
Goessel, M., Sogomonyan, E.S.Year:
1994
Language:
english
DOI:
10.1109/VTEST.1994.292320
File:
PDF, 497 KB
english, 1994