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Characterization of spectral selectivity of tin-doped In2O3 thin films using spectroscopic ellipsometry
Jing, Liu, Hong, Wang, You-Ran, YangVolume:
267
Language:
english
Journal:
Surface and Coatings Technology
DOI:
10.1016/j.surfcoat.2014.09.055
Date:
April, 2015
File:
PDF, 1.50 MB
english, 2015