[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies - Washington, DC, USA (5-6 Dec. 2002)] 60th ARFTG Conference Digest, Fall 2002. - Nose-to-nose oscilloscope calibration phase error inherent in the sampling circuitry
Remley, K.A.Year:
2002
Language:
english
DOI:
10.1109/ARFTGF.2002.1218690
File:
PDF, 849 KB
english, 2002