[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Key technologies for 500-MHz VLSI system ULTIMATE
Tamama, T., Narumi, N., Otsuji, T.-i., Suzuki, M., Sudo, T.Year:
1988
Language:
english
DOI:
10.1109/TEST.1988.207787
File:
PDF, 387 KB
english, 1988