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Modeling of avalanche multiplication and excess noise factor in In[sub 0.52]Al[sub 0.48]As avalanche photodiodes using a simple Monte Carlo model
S. C. L. T. Mun, C. H. Tan, Y. L. Goh, A. R. J. Marshall, J. P. R. DavidVolume:
104
Year:
2008
Language:
english
DOI:
10.1063/1.2952003
File:
PDF, 876 KB
english, 2008