![](/img/cover-not-exists.png)
[IEEE 2013 5th Asia Symposium on Quality Electronic Design (ASQED) - Penang, Malaysia (2013.08.26-2013.08.28)] Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) - Detecting resistive-opens in RRAM using Programmable DfT scheme
Haron, Nor Zaidi, Arshad, Norsuhaidah, Herman, Sukreen HanaYear:
2013
Language:
english
DOI:
10.1109/ASQED.2013.6643558
File:
PDF, 405 KB
english, 2013