[IEEE Proceedings of 1995 IEEE International Reliability Physics Symposium - Las Vegas, NV (1995.04.4-1995.04.6)] 33rd IEEE International Reliability Physics Symposium - Device reliability and optimization on halo MOSFETs
Duheon Song,, Junhee Lim,, Kyungho Lee,Year:
1995
Language:
english
DOI:
10.1109/RELPHY.1995.513691
File:
PDF, 452 KB
english, 1995