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[IEEE 2009 10th International Conference on Ultimate Integration on Silicon (ULIS - Aachen, Germany (2009.03.18-2009.03.20)] 2009 10th International Conference on Ultimate Integration of Silicon - Efficient simulations of 6σ VT distributions due to Random Discrete Dopants
Reid, Dave, Millar, Campbell, Roy, Gareth, Roy, Scott, Asenov, AsenYear:
2009
Language:
english
DOI:
10.1109/ULIS.2009.4897530
File:
PDF, 664 KB
english, 2009