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[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - Fast Kerf- and Tester-Compatible Method for RC Characterization of DRAM Memory Cells
Sauerbrey, Jens, Holzapfl, Birgit, Unertl, Marcus, Haywood, Theo, Wohlrab, Erdmute, Frey, Alexander, Thewes, RolandYear:
2006
Language:
english
DOI:
10.1109/ESSDER.2006.307727
File:
PDF, 484 KB
english, 2006