[IEEE 1996 IEEE Hong Kong Electron Devices Meeting - Hong Kong (29 June 1996)] Proceedings 1996 IEEE Hong Kong Electron Devices Meeting - Area-efficient layout design for output transistors with consideration of ESD reliability
Ming-Dou Ker,, Chung-Yu Wu,, Chien-Chang Huang,, Hun-Hsien Chang,, Chau-Neng Wu,, Ta-Lee Yu,Year:
1996
Language:
english
DOI:
10.1109/HKEDM.1996.566324
File:
PDF, 431 KB
english, 1996