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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Fast extended test access via JTAG and FPGAs
Devadze, Sergei, Jutman, Artur, Aleksejev, Igor, Ubar, RaimundYear:
2009
Language:
english
DOI:
10.1109/TEST.2009.5355668
File:
PDF, 227 KB
english, 2009