[IEEE 2005 International Symposium on Electromagnetic...

[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - A hybrid approach to decrease port influence in transmission line charaterization

Jianmin Zhang,, Pommerenke, D.J., Drewniak, J.L., DuBroff, R.E., Zhiping Yang,, Wheling Cheng,, Fisher, J., Camerlo, S.

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Volume:

Year:

2005

Language:

english

DOI:

10.1109/ISEMC.2005.1513611

File:

PDF, 335 KB

english, 2005

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