![](/img/cover-not-exists.png)
[IEEE 2010 Student Conference on Research and Development (SCOReD) - Kuala Lumpur, Malaysia (2010.12.13-2010.12.14)] 2010 IEEE Student Conference on Research and Development (SCOReD) - Failure analysis using IDD current leakage and photo localization for gate oxide defect of CMOS VLSI
Abdullah, Farisal, Nayan, Nafarizal, Mahadi Abdul Jamil, MuhammadYear:
2010
Language:
english
DOI:
10.1109/SCORED.2010.5704033
File:
PDF, 1.11 MB
english, 2010